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Upcoming Training Events From Veeco
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The Importance of Surface Topography in Product Quality and Performance
Online - Hosted by Quality Magazine
September 21, 2010

Explore the use of non-contact WLI to investigate part behavior and failures in automotive, aerospace, machining, orthopedic & solar industries.

Icon Workshop
October 5, 2010

You are invited to join us for an informative and interactive workshop to learn more about the unprecedented capabilities of the Dimension® Icon® Atomic Force Microscope (AFM) from Veeco Instruments in Göteborg, Sweden on October 05th.

Scanning Probe Microscopy Conference & User Meeting
Oct 19 - Oct 20, 2010

Your are invited to join the UK Veeco SPM Conference and Users Meeting which will focus on exciting new SPM applications and recent technology developments on October 19-20 in Nottingham, UK.

Réunion Annuelle des Utilisateurs de Microscopie à Force Atomique (AFM)
Nov 22 - Nov 23, 2010

Nous avons le plaisir de vous convier à la nouvelle édition de notre Réunion des Utilisateurs de Microscopie à Force Atomique (AFM) qui se déroulera les lundi 22 et mardi 23 novembre prochains.

 
 
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