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Discover More with PeakForce QNM
PeakForce™ QNM™ is a patent-pending, new imaging mode that allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution.
Based on Veeco’s exclusive Peak Force Tapping™ technology, this mode records very fast force response curves at every single pixel in the image. Thus, the forces applied to the sample are precisely controlled and a variety of probes can be used. It also allows measurement of material properties over an extremely wide range: ~1 MPa to 50 GPa for modulus and 10 pN to 10 µN for adhesion, encompassing many sample types. These capabilities dramatically exceed those of any other technique for nanoscale materials characterization.
The benefits of PeakForce QNM include longer probe lifetimes, fewer probe exchanges, and improved sample integrity and measurement consistency.
- Obtain maps of sample modulus and adhesion, along with high-resolution topography images with little or no extra effort
- PeakForce Tapping precisely controls imaging force to keep indentations small, enabling non-destructive and high-resolution imaging
- Material properties can be characterized over a very wide range, covering samples in many different research areas
PeakForce QNM, available on all Veeco high-performance AFMs, will change the way you think about and use atomic force microscopy!
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See the PeakForce QNM Brochure
The World's Leader in AFM is now Your Leader in Probes and SPM Accessories
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