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Experience the Future of AFM
ScanAsyst™ is the world’s first image-optimization scan mode for AFMs. This patent-pending innovation utilizes intelligent algorithms to automatically and continuously monitor image quality, and to make the appropriate parameter adjustments. This frees researchers from the complex and tedious task of adjusting setpoints, feedback gains, and scan rates, making imaging as easy as simply selecting a scan area and scan size for almost any sample in either air or fluid.
ScanAsyst is based on Veeco’s new, patent-pending general-purpose imaging mode, Peak Force Tapping™. This proprietary mode performs a very fast force curve at every pixel in the image. The peak force of each of these curves is then used as the imaging feedback signal, providing direct force control. This allows it to operate at even lower forces than TappingMode, which helps protect delicate samples and tips.
ScanAsyst, available on all of Veeco's high-performance AFMs, will change the way you think about and use atomic force microscopy!
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The World's Leader in AFM is now Your Leader in Probes and SPM Accessories
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