Wyko NT9000 Series Profilers

Product Features

Measure surface topography with an unmatched combination of sub-nanometer resolution, gauge-capable repeatability, and production-level speed.

Large Z-range of up to 10mm for extremely high step measurements
Fastest measurement speed for maximum throughput
Industry-leading automation and analysis software
Optional modules and packages for customized application flexibility

NEW Capability for Motion Displacement Analysis

Veeco' In-Motion Solution: MEMS Package provides accurate measurements of devices as they actuate.

In-Motion integrates a proprietary stroboscopic technique with traditional white light interferometry and powerful analysis software to deliver simultaneous static and dynamic device measurements on a single system!

In-Motion empowers researchers and manufacturers to

perform failure analysis
improve quality control
increase yield

More Information

Datasets

ACT NOW! Faster, Better Measurements. Masterful Results.

Get More Information: NT9000 Series Optical Profilers

If your facility requires fast, repeatable, non-contact 3D characterization, you need an NT9000 Series Profiler from the world’s foremost interferometry manufacturer. For more information about the NT9000 Series profilers or the In-Motion Solution:MEMS Package, please submit the form below.

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