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Veeco Introduces OASIS 1750 Protein Crystal Imaging System
Veeco Introduces OASIS 1750 Protein Crystal Imaging System
Mar 31, 2003
Veeco Introduces OASIS 1750 Protein Crystal Imaging System
Mar 31, 2003
Tucson, AZ, March 31, 2003 — Veeco Instruments announces its new OASIS 1750 Protein Crystal Imaging System for both small and large scale structural proteomics life science research efforts. By imaging more than 8000 experiments per hour, this second-generation, automated system is the most efficient instrument for finding, characterizing and scoring crystal growth. Because of its high throughput, the OASIS 1750 rapidly determines protein crystal growth and supports a system capacity of more than 5000 plates without the need for additional imaging resources.
“The OASIS 1750 represents an important step for Veeco -- our first phase of a broad entry into the life science drug discovery marketplace,” said Anthony Martinez, VP and General Manager of Veeco Optical and Industrial Metrology. “By leveraging our metrology expertise we are helping advance the fundamental understanding of how proteins function and their potential to aid in the fight against disease. The Oasis 1750 addresses an important need for our research customers: by quickly and reliably detecting protein crystal growth, this new system removes a major bottleneck on the road to drug discovery.”
Protein crystal detection has traditionally been a tedious, manual process, hampered by two critical shortcomings: a) manual inspection is slow, and b) inspectors can miss vitally important crystals, especially under fatigued conditions. The OASIS 1750 inspects more than 20 times faster than a manual inspector, and more than 3-8 times faster than any other currently available system, allowing multiple views during each crystallization cycle. The system “scores” each well based on the presence of crystals or precipitates, automatically logging the information to a database. Veeco’s field-proven, rules-based inspection software helps researchers focus analysis efforts on the experiments which yield crystals. Critical to successfully automating the inspection process is the ability to avoid “false negatives,” or negative readings of wells that have formed crystals. A unique auto focus system and patent-pending illumination technique dramatically reduce false negatives, especially in the shadowy “occlusion zones” at the edges of test droplets. These regions are a source of false-negatives for lower-powered, automated inspections systems.
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide semiconductor, data storage, telecommunications/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco’s manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/
“The OASIS 1750 represents an important step for Veeco -- our first phase of a broad entry into the life science drug discovery marketplace,” said Anthony Martinez, VP and General Manager of Veeco Optical and Industrial Metrology. “By leveraging our metrology expertise we are helping advance the fundamental understanding of how proteins function and their potential to aid in the fight against disease. The Oasis 1750 addresses an important need for our research customers: by quickly and reliably detecting protein crystal growth, this new system removes a major bottleneck on the road to drug discovery.”
Protein crystal detection has traditionally been a tedious, manual process, hampered by two critical shortcomings: a) manual inspection is slow, and b) inspectors can miss vitally important crystals, especially under fatigued conditions. The OASIS 1750 inspects more than 20 times faster than a manual inspector, and more than 3-8 times faster than any other currently available system, allowing multiple views during each crystallization cycle. The system “scores” each well based on the presence of crystals or precipitates, automatically logging the information to a database. Veeco’s field-proven, rules-based inspection software helps researchers focus analysis efforts on the experiments which yield crystals. Critical to successfully automating the inspection process is the ability to avoid “false negatives,” or negative readings of wells that have formed crystals. A unique auto focus system and patent-pending illumination technique dramatically reduce false negatives, especially in the shadowy “occlusion zones” at the edges of test droplets. These regions are a source of false-negatives for lower-powered, automated inspections systems.
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide semiconductor, data storage, telecommunications/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco’s manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/