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New Data Sheet Featuring NanoScope IV SPM Controller Now Available!
New Data Sheet Featuring NanoScope IV SPM Controller Now Available!

Oct 05, 2001
Santa Barbara, CA, October 5, 2001 — Digital Instruments, Veeco Metrology Group announces the release of the new Data Sheet, "NanoScope IV SPM Controller: Gateway to the Future of SPM". This Data Sheet reviews Faster scanning for increased productivity, OneScan™ Imaging, Quadrex™ Technology, AFM Prob Q-Control, Phase Detection Magnetic Force Microscopy (MFM), and Flexibility and Expandability of the NanoScope IV Controller.

The NanoScope IV improves conventional Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) systems in every important aspect of operation