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Adavanced Users Training in Atomic Force Microscopy of Polymers
Adavanced Users Training in Atomic Force Microscopy of Polymers

Apr 04, 2001
Santa Barbara, CA, April 4, 2001 — Digital Instruments, Veeco Metrology, is offering a new course for Advanced Training on AFM of polymers for NanoScope® users to be held June 20-22, 2001 in Santa Barbara, CA.

Coordinated by Dr. Sergei Magonov, the course is designed to help users improve their knowledge of AFM techniques as well as to acquaint them with new approaches to polymer imaging. In addition, the 2