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PittCon 2001 Symposium Presentation Available via Webcast and VHS Video through June 5th
PittCon 2001 Symposium Presentation Available via Webcast and VHS Video through June 5th
Mar 30, 2001
PittCon 2001 Symposium Presentation Available via Webcast and VHS Video through June 5th
Mar 30, 2001
Santa Barbara, CA, March 30, 2001 — Following highly successful sessions in '98, '99, and '00, a fourth symposium on Atomic Force Microscopy (AFM) was held on Monday, March 5th 2001 at PittCon 2001. The Symposium, chaired by Monte Heaton of AFM leader Digital Instruments/Veeco Metrology Group, focused on a variety of applications of AFM — including biology, materials science, and polymers.
A special talk, given by Dr. Philip Russell of North Carolina State University, entitled "Scanning Probe/Atomic Force Microscopy and Scanning Electron Microscopy: Complementary Microscopy and Microanalysis" explained the advantages and complementary capabilities of AFM relative to other microscopies (SEM, TEM) and analytical techniques.
This presentation is available for webcast viewing on www.webcasting.com/pittcon through June 5, 2001 and is also available in VHS Video by contacting Digital Instruments, Veeco Metrology Group directly. Please email Mary McKeown-Christie (marym@di.com) with your request.
Veeco Instruments Inc., headquartered in Plainview, New York is a worldwide leader in metrology tools for the data storage, semiconductor and research and scientific markets; and process equipment etch and deposition tools for the data storage and opto-telecommunications markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Virginia, and Arizona. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific.
A special talk, given by Dr. Philip Russell of North Carolina State University, entitled "Scanning Probe/Atomic Force Microscopy and Scanning Electron Microscopy: Complementary Microscopy and Microanalysis" explained the advantages and complementary capabilities of AFM relative to other microscopies (SEM, TEM) and analytical techniques.
This presentation is available for webcast viewing on www.webcasting.com/pittcon through June 5, 2001 and is also available in VHS Video by contacting Digital Instruments, Veeco Metrology Group directly. Please email Mary McKeown-Christie (marym@di.com) with your request.
Veeco Instruments Inc., headquartered in Plainview, New York is a worldwide leader in metrology tools for the data storage, semiconductor and research and scientific markets; and process equipment etch and deposition tools for the data storage and opto-telecommunications markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Virginia, and Arizona. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific.