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MultiMode PicoForce Revolutionizes Force Spectroscopy
MULTIMODE PICOFORCE REVOLUTIONIZES FORCE SPECTROSCOPY
Dec 07, 2001
Santa Barbara, CA, December 7, 2001 -- Veeco Metrology Group announces the release of the Digital Instruments PicoForce™ Scanning Probe Microscope Control System for demanding nanoscience and materials research. The PicoForce system, combined with powerful software developed specifically for force spectroscopy, enables accurate force measurements and manipulation of biological or material samples at the pico-Newton level.
Most force spectroscopy experiments demand precise, accurate control of tip-sample separation and low-noise detection of cantilever deflection, explains Bob Tench, product manager at Veeco Metrology Group. The new PicoForce incorporates several innovations in nanotechnology that allow unprecedented control of these aspects, making this a particularly interesting product in the study of protein unfolding, antibody-antigen interactions, molecular motors, and nanoscale mechanical properties.
The MultiMode PicoForce utilizes the world''s best-selling atomic force microscope (AFM), a scanner with closed-loop control of the Z-axis that accurately controls tip-sample separation, and new software GUI developed specifically for force spectroscopy (see www.veeco.com/picoforce). It also includes an innovative handheld tool that features unparalleled sensitivity to tip-sample interaction force. Another cost-saving feature is the PicoForce system''s modular design, which allows existing MultiMode AFM users to upgrade individual components rather than start over with entirely new equipment.
Veeco Instruments, Inc. (NASDAQ: VECO) is a worldwide leader in process equipment and metrology tools for the optical telecommunications/wireless, data storage, semiconductor and research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan, and Asia Pacific. Additional information on Veeco can be found at www.veeco.com.
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 Fig. 1. MultiMode™ PicoForce™ Scanning Probe Microscopy (SPM) Control System. Featuring Hand-held PicoAngler™, PicoForce Scanner, MultiMode AFM, PicoForce Controller with latest Nanoscope® Sofware featuring enhanced Graphic User Interface (GUI). |  |
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 Figure 2. New Graphic User Interface (GUI) showing force curve measurement of Titin muscle molecule. |  |
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