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Utilizing White Light Interferometry to Advance Auto Industry Component Efficiency and Medical Device Quality

Donald Cohen, Ph.D., has been using white light interferometers since 1994 to help industry solve problems related to squeaks, leaks, friction, wear, appearance, adhesion and other surface texture related issues.

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Featured Researcher

Dr. Donald Cohen received his undergraduate and graduate degrees in Physics and Optical Sciences from the University of Michigan-Dearborn and the University of Arizona, respectively.

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AFM Research Spotlight

Integrating AFM with Confocal Microscopy to Study Mechano-chemical Stresses on Live Cells

December 09, 2008 | 0 Comments

Using AFM to Visualize Helical Structures via Two-Dimensional Helix Bundle Formation

November 10, 2008 | 2 Comments

Nanophysiology Explored with the Atomic Force Microscope

September 01, 2008 | 0 Comments

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Metrology Spotlight

Utilizing White Light Interferometry to Advance Auto Industry Component Efficiency and Medical Device Quality

June 15, 2009 | 0 Comments