Veeco to Host 6th Annual International Nanoscience Conference in Europe
January 14, 2008
WOODBURY, N.Y.--(BUSINESS WIRE)--Jan. 14, 2008--Veeco Instruments Inc. (Nasdaq: VECO), a leading provider of instrumentation to the nanoscience community, announced that on-line registration and call for papers are now open for the "Seeing at the Nanoscale VI" conference to be held in Berlin, Germany at the Maritim proArte Hotel on July 9-11, 2008. Celebrating its sixth year, the conference provides an optimum setting for scientists to share information on a wide-variety of cutting-edge nanotechnology topics. The event is sponsored by Veeco Instruments and supported by the Department of Physics, Humboldt University Berlin.
"Seeing at the Nanoscale has become a prime international event featuring the latest advances in nanoscience with scanning probes and their strong impact on nanotechnologies," commented this year's conference chairman, Physics Professor Dr. Jurgen P. Rabe from Humboldt University Berlin. "This is a very exciting time in the nanosciences, and I am looking forward to the innovations and research that will be discussed this year. The last time the conference was held in Europe, it was an outstanding success, and I am delighted to welcome everyone to Berlin!"
The three-day conference, themed "Exploring the Future of Nanotechnology," provides both a platform and a tremendous opportunity for scientists worldwide to discuss their latest discoveries, and to share their research on next-generation nanotechnology with their peers and other visionaries in the field of nanoscience. Each year the conference hosts several hundred international researchers and scientists. Conference sessions for 2008 include:
Session I Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probes Chair Georg Schitter, TU Delft, Delft, The Netherlands Keynote Toshio Ando, Kanazawa University, Kanazawa, Japan Invited Speaker Oscar Custance, National Institute for Materials Science (NIMS), Tsukuba, Japan
Session II From single biomolecules to cells: using AFM and combined AFM-optical Chair Hans Oberleithner, Universitat Munster, Munster, Germany Keynote Daniel Muller, BIOTEC, Dresden, Germany Invited Speaker Clive Roberts, Chair of Pharmaceutical Nanotechnology, School of Pharmacy and Director of the Nottingham Nanotechnology and Nanoscience Centre The University of Nottingham, United Kingdom
Session III Next generation materials and polymer systems Chair G.J. Vancso, Universiteit Twente, Enschede, The Netherlands Keynote Jiro Kumaki, Yashima Super-structured Helix Project, ERATO, JST, Nagoya, Japan Invited Speaker Christian Fretigny, CNRS, Paris, France
Session IV Beyond topography: measurement of physical properties at the Nanoscale - nanomechanical, electrical, optical, magnetic and thermal Chair Robert W. Stark, Ludwig-Maximilians-Universitat Munchen, Munich, Germany Keynote Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, Belgium Invited Speaker Ozgur Sahin, Harvard University, USA
Additional conference information, registration and abstract submission can be found at www.veeco.com/nanoconference. Don't miss out on one of the premier nanoscience events of 2008. Register today!
Veeco Instruments Inc. provides solutions for nanoscale applications in the worldwide data storage, semiconductor, HB-LED/wireless and scientific research markets. Our Metrology products are used to measure at the nanoscale and our Process Equipment tools help create nanoscale devices. Veeco's manufacturing and engineering facilities are located in New York, New Jersey, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com/.
CONTACT: Veeco Instruments Inc. Corporate: Debra Wasser, 516-677-0200 x1472 SVP, Investor Relations & Corp. Communications or European Media: Stephanie Pietri, 33 1 64 59 35 20 European Marketing Communication Manager or Metrology & Instrumentation: Karen Gertz, 805-967-2700 x2412 Metrology Marketing Communications SOURCE: Veeco Instruments Inc.