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Semiconductor

 

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View results for: Metrology & InstrumentationProcess Equipment Metrology & Instrumentation Systems

AFM /SPM

• Dimension 3100
• Dimension 5000 Scanning Probe Microscope
• Dimension V Scanning Probe Microscope (SPM)
• MultiMode
• MultiMode V

Automated AFM / AFP

• InSight 3DAFM
• Dimension AFP
• Dimension Vx200/300 AFP
• Dimension Vx210/310 AFP
• Dimension X
• Dimension X3D for Data Storage
• Dimension X3D Photomask

Optical Profilers

• Wyko NT9100 Optical Profiler
• Wyko NT9800
• Wyko NT1100
• Wyko NT9300
• Wyko SP3050
• Wyko SP3250

Stylus Profilers

• Dektak 150
• Dektak 8