Metrology & Instrumentation
Process Equipment
Epitaxial Equipment
Metrology & Instrumentation
Optical Profilers - Wyko Systems
Wyko NT9100 Optical Profiler 
The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability.
The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability.
Wyko NT9800 Optical Profiler
The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution.
The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution.
Wyko NT9300 Optical Profiler
The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
Wyko HD9800 Optical Profiler for Data Storage
The highest performance profiler for data storage metrology. This system provides low-cost, production-worthy non-contact process control monitoring of magnetic thin-film heads in rowbar or slider forms.
The highest performance profiler for data storage metrology. This system provides low-cost, production-worthy non-contact process control monitoring of magnetic thin-film heads in rowbar or slider forms.
Wyko SP9900 Large-Format Surface Profiling System
Veeco's third-generation, large-format surface profiling system provides unprecedented measurement performance and capability on substrate panels, bumped substrates, flat panels, and circuit boards.
Veeco's third-generation, large-format surface profiling system provides unprecedented measurement performance and capability on substrate panels, bumped substrates, flat panels, and circuit boards.
Wyko Optical Metrology Module
Stand-alone model brings high speed, automated metrology to the factory floor, for in-situ production measurement and 100% sampling.
Stand-alone model brings high speed, automated metrology to the factory floor, for in-situ production measurement and 100% sampling.