Metrology & Instrumentation
Atomic Force Microscopes - Systems

• Highest Performance and Resolution
• Versatility to Satisfy More Applications

• Faster and Easier Expert-Quality Results
• World-Renowned Productivity and Reliability

• New Standard for Atomic Force Microscopy and Light Microscopy Integration
• Uncompromised Performance from Both Techniques

• Easiest to Use and Most Productive Life Science Atomic Force Microscope
• Simple, Effective Solutions for Biological Samples

• Ultimate Performance
• Immediate Research-Quality Results

• Easy to Use with Expert Functionality
• One-Platform - Endless Possiblitiies

Features:

• Exclusive Whisper™ piezo scan technology delivers closed-loop performance with noise-levels approaching highest level open-loop systems
• Seamless coverage from 90 microns all the way to atomic resolution
• Wide range of advanced functionality for physical, material & life sciences
• Now with new modes for materials and device characterization

Benefits:

• Higher closed-loop performance means routinely obtaining the most accurate data even in the highest resolution applications
• Higher resolution optics enable faster, more accurate probe positioning and shorter time to better data
• A full suite of advanced SPM modes provides powerful research flexibility
• New: Dark Lift for artifact-free characterization of semiconductor devices and photovoltaics

Features:

• 3-axis high accuracy with closed-loop and sensored-Z piezo scanners
• Compact easy to handle microscope head adaptable to most environments
• Scanning tip design provides unlimited sample size capability
• Extensive control & analysis software allows simultaneous scanning and analysis

Benefits:

• High-value, low-cost entry-level AFM
• Get research-level results and make AFM regular part of research tools
• Easily expand for Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) and Nanolithography capabilities

Features:

• Supports both standard and advanced SPM imaging techniques
• Well suited to measure surface characteristics of semiconductor wafers, lithography masks, magnetic media, and other samples up to 200mm in diameter
• Versatile selection of scanners and controllers
• Precise laser tracking and the ability to change scanning techniques without tools

Benefits:

• Sample size convenience and flexibility
• Powerful NanoScope controller enables the maximum scan size to a few nanometers with full 16-bit resolution
• Dimension DAFMLN low noise head that guarantees low-noise scanning and superior reliability

Features:

• Provides highly reliable, automated surface metrology for semiconductor, data storage and optics applications
• Capable of measuring up to one hundred areas on samples up to 350mm in diameter.
• Does not require sample destruction, pretreament or modification
• Offered with both closed-loop and open-loop scanning heads

Benefits:

• Provides more surface data in less time and in nondestructive manner
• Detects surface faults and measures surface roughness and other features in three dimensions
• Supports comprehensive range of atomic force microscopy and scanning tunneling microscopy techniques

Features:

• Preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation
• Hybrid XYZ scanner provides six times lower Z sensor noise and precise X/Y control for manipulation of molecules
• NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120)

Benefits:

• Improved accuracy, faster processing time and wide range of AFM and STM techniques supported
• Modular design for broad range of applications
• Integration of Dimension platform and NanoScope V capabilities improves flexibility, ease of use and high product throughput

Features:

• Preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation
• Combines proven Dimension platform, advanced NanoScope V controller and sophisticated Hybrid XYZ scanner
• Hybrid XYZ scanner provides six times lower Z sensor noise and precise X/Y control for manipulation of molecules

Benefits:

• Record and analyze tip-sample interactions of nanoscale events at timescales previously inaccessible to SPM
• Reliable, high-speed (50 MHz) data capture of high-pixel-density images (5120 x 5120)
• Advances complex techniques such as molecular manipulation and “pulling” of samples being scanned, for greater details about material properties

Features:

• Complete range of AFM techniques for surface characterization of properties
• Compact hardware design and user-friendly software enables faster, easer data acquisition
• NanoScope controller provides flexible scanning range from maximum scan down to a few nanometers
• Heater and cooler accessories and environmental chamber

Benefits:

• Cited in more scientific publications than all competing systems combined
• Proven performance in over a thousand installations
• Multiple scanners let researchers tailor system to meet individual research goals

Features:

• Offers three powerful electrochemical systems for studying a wide range of electrochemical processes
• Electrochemical Scanning Tunneling Microscope (ECSTM) delivers atomic- and molecular-resolution STM imaging of electrode surfaces in solution under electrochemical control
• Electrochemical Atomic Force Microscope (ECAFM) allows nanometer-resolution AFM imaging of electrode surfaces in solution under electrochemical control
• Scanning Electrochemical Potential Microscope (SECPM) utilizes exclusive Veeco technology to perform potential profiling of the electrical double layer

Benefits:

• Provides flexible choices for researchers investigating nanoscale-features in electrochemical processes
• Improved spatial resolution, ease of use and wide range of AFM and STM techniques available
• Exclusive Veeco SECPM technology offers fundamental insights into electrochemical processes at the crucial solid/liquid interfaces

Features & Benefits:

• Brings unprecedented accuracy and flexibility to molecular biology and nanoscale materials research
• Handheld PicoAngler tool allows users to manually explore tip-sample interactions with incredible ease
• Particularly useful for single-molecule force spectroscopy, providing highly sensitive approach and retraction of the cantilever tip
• Scanner incorporates closed-loop Z axis with 20 microns vertical range and X/Y scan of >40 microns

Features & Benefits:

• Combines AFM with environmental controls and hermetically sealed sample chamber
• Enables observation of sample reactions to a variety of complex environmental conditions while scanning
• Ideal for material sciences, electrochemistry, polymer technologies, life sciences, and other applications