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Metrology & Instrumentation
Atomic Force Microscopes -
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Metrology & Instrumentation
- New Standard for Atomic Force Microscopy and Light Microscopy Integration
- Uncompromised Performance from Both Techniques
- Easiest to Use and Most Productive Life Science Atomic Force Microscope
- Simple, Effective Solutions for Biological Samples
- Ultimate Performance
- Immediate Research-Quality Results
- Easy to Use with Expert Functionality
- One-Platform - Endless Possiblitiies
Features:
- Exclusive Whisper™ piezo scan technology delivers closed-loop performance with noise-levels approaching highest level open-loop systems
- Seamless coverage from 90 microns all the way to atomic resolution
- Wide range of advanced functionality for physical, material & life sciences
- Now with new modes for materials and device characterization
Benefits:
- Higher closed-loop performance means routinely obtaining the most accurate data even in the highest resolution applications
- Higher resolution optics enable faster, more accurate probe positioning and shorter time to better data
- A full suite of advanced SPM modes provides powerful research flexibility
- New: Dark Lift for artifact-free characterization of semiconductor devices and photovoltaics
Features:
- 3-axis high accuracy with closed-loop and sensored-Z piezo scanners
- Compact easy to handle microscope head adaptable to most environments
- Scanning tip design provides unlimited sample size capability
- Extensive control & analysis software allows simultaneous scanning and analysis
Benefits:
- High-value, low-cost entry-level AFM
- Get research-level results and make AFM regular part of research tools
- Easily expand for Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) and Nanolithography capabilities
Features:
- Supports both standard and advanced SPM imaging techniques
- Well suited to measure surface characteristics of semiconductor wafers, lithography masks, magnetic media, and other samples up to 200mm in diameter
- Versatile selection of scanners and controllers
- Precise laser tracking and the ability to change scanning techniques without tools
Benefits:
- Sample size convenience and flexibility
- Powerful NanoScope controller enables the maximum scan size to a few nanometers with full 16-bit resolution
- Dimension DAFMLN low noise head that guarantees low-noise scanning and superior reliability
Features:
- Provides highly reliable, automated surface metrology for semiconductor, data storage and optics applications
- Capable of measuring up to one hundred areas on samples up to 350mm in diameter.
- Does not require sample destruction, pretreament or modification
- Offered with both closed-loop and open-loop scanning heads
Benefits:
- Provides more surface data in less time and in nondestructive manner
- Detects surface faults and measures surface roughness and other features in three dimensions
- Supports comprehensive range of atomic force microscopy and scanning tunneling microscopy techniques
Features:
- Preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation
- Hybrid XYZ scanner provides six times lower Z sensor noise and precise X/Y control for manipulation of molecules
- NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120)
Benefits:
- Improved accuracy, faster processing time and wide range of AFM and STM techniques supported
- Modular design for broad range of applications
- Integration of Dimension platform and NanoScope V capabilities improves flexibility, ease of use and high product throughput
Features:
- Preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation
- Combines proven Dimension platform, advanced NanoScope V controller and sophisticated Hybrid XYZ scanner
- Hybrid XYZ scanner provides six times lower Z sensor noise and precise X/Y control for manipulation of molecules
Benefits:
- Record and analyze tip-sample interactions of nanoscale events at timescales previously inaccessible to SPM
- Reliable, high-speed (50 MHz) data capture of high-pixel-density images (5120 x 5120)
- Advances complex techniques such as molecular manipulation and “pulling” of samples being scanned, for greater details about material properties
Features:
- Measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields
- New high-speed NanoScope V controller adds powerful capabilities to world’s most field-proven SPM
- Reliable, high-speed data capture of high-pixel-density images (5120 x 5120)
- Available with closed-loop scanner option
Benefits:
- Provides very fast scan rates with the highest levels of precision
- User-friendly EasyAFM software package provide easy-to-follow graphic user interface
- Modular design and environmental control for more productive imaging and wider rang of research applications
Features:
- Complete range of AFM techniques for surface characterization of properties
- Compact hardware design and user-friendly software enables faster, easer data acquisition
- NanoScope controller provides flexible scanning range from maximum scan down to a few nanometers
- Heater and cooler accessories and environmental chamber
Benefits:
- Cited in more scientific publications than all competing systems combined
- Proven performance in over a thousand installations
- Multiple scanners let researchers tailor system to meet individual research goals
Features:
- Offers three powerful electrochemical systems for studying a wide range of electrochemical processes
- Electrochemical Scanning Tunneling Microscope (ECSTM) delivers atomic- and molecular-resolution STM imaging of electrode surfaces in solution under electrochemical control
- Electrochemical Atomic Force Microscope (ECAFM) allows nanometer-resolution AFM imaging of electrode surfaces in solution under electrochemical control
- Scanning Electrochemical Potential Microscope (SECPM) utilizes exclusive Veeco technology to perform potential profiling of the electrical double layer
Benefits:
- Provides flexible choices for researchers investigating nanoscale-features in electrochemical processes
- Improved spatial resolution, ease of use and wide range of AFM and STM techniques available
- Exclusive Veeco SECPM technology offers fundamental insights into electrochemical processes at the crucial solid/liquid interfaces
Features & Benefits:
- Brings unprecedented accuracy and flexibility to molecular biology and nanoscale materials research
- Handheld PicoAngler tool allows users to manually explore tip-sample interactions with incredible ease
- Particularly useful for single-molecule force spectroscopy, providing highly sensitive approach and retraction of the cantilever tip
- Scanner incorporates closed-loop Z axis with 20 microns vertical range and X/Y scan of >40 microns
Features & Benefits:
- Combines AFM with environmental controls and hermetically sealed sample chamber
- Enables observation of sample reactions to a variety of complex environmental conditions while scanning
- Ideal for material sciences, electrochemistry, polymer technologies, life sciences, and other applications